Author/Creator: Vogrig, D. / Journal: Microelectronics and reliability - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

New Search Author/Creator Vogrig, D. Journal Microelectronics and reliability

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1. Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs. (November 2022)

Authors:: Modolo, N.; Fregolent, M.; Masin, F.; Benato, A.; Bettini, A.; Buffolo, M.; De Santi, C.; Borga, M.; Posthuma, N.; Bakeroot, B.; Decoutere, S.; Vogrig, D.; Neviani, A.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Journal:: Microelectronics and reliability
Issue:: Volume 138(2022)
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Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms)

2. Comparison between Cu(In, Ga)Se2 solar cells with different back contacts submitted to current stress. (November 2022)

Authors:: Bertoncello, M.; Barbato, M.; Caria, A.; Buffolo, M.; De Santi, C.; Rampino, S.; Pattini, F.; Spaggiari, G.; Trivellin, N.; Vogrig, D.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
Journal:: Microelectronics and reliability
Issue:: Volume 138(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms)