1. Clamp voltage and ideality factor in laser diodes. Issue 9 (August 2015) Authors: Vanzi, M.; Mura, G.; Marcello, G.; Martines, G. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1736 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. ESD tests on 850 nm GaAs-based VCSELs. (September 2016) Authors: Vanzi, M.; Mura, G.; Marcello, G.; Xiao, K. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 617 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. ESD tests on 850 nm GaAs-based VCSELs. (September 2016) Authors: Vanzi, M.; Mura, G.; Marcello, G.; Xiao, K. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 617 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Further improvements of an extended Hakki-Paoli method. (September 2018) Authors: Vanzi, M.; Mura, G.; Martines, G. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 859 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Optical gain in laser diodes with null reflectivity. (September 2019) Authors: Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Ueno, Y. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Peculiar failure mechanisms in GaN power transistors. (November 2020) Authors: Vanzi, M.; Mura, G. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Practical optical gain by an extended Hakki-Paoli method. (September 2017) Authors: Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 579 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Recent improvements in photometric stereo for rock art 3D imaging. Issue 2 (2015) Authors: Dessì, R.; Mannu, C.; Rodriguez, G.; Tanda, G.; Vanzi, M. Journal: Digital applications in archaeology and cultural heritage Issue: Volume 2:Issue 2/3(2015) Page Start: 132 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗