1. An analysis of the breadth and depth of coverage of emerging market countries by commercial patent information sources. (September 2017) Authors: Cole, Nicholas; Ede, Mark; Barcelon-Yang, Cynthia; Harper, Mark; Langeveld, Arjan; Noll, Torsten; Swinkels, Joop; Vang, Guido Journal: World patent information Issue: Volume 50(2017) Page Start: 73 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗