Author/Creator: Vandervorst, W - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Vandervorst, W

1. Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques. (6th August 2015)

Authors:: Eyben, P; Bisiaux, P; Schulze, A; Nazir, A; Vandervorst, W
Journal:: Nanotechnology
Issue:: Volume 26:Number 35(2015)
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Record Type:: Journal Article
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2. Observation and understanding of anisotropic strain relaxation in selectively grown SiGe fin structures. (9th March 2017)

Authors:: Schulze, A; Loo, R; Ryan, P; Wormington, M; Favia, P; Witters, L; Collaert, N; Bender, H; Vandervorst, W; Caymax, M
Journal:: Nanotechnology
Issue:: Volume 28:Number 14(2017)
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Record Type:: Journal Article
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3. Post-ion beam induced degradation of copper layers in transmission electron microscopy specimens. (15th October 2015)

Authors:: Seidel, F; Richard, O; Bender, H; Vandervorst, W
Journal:: Semiconductor science and technology
Issue:: Volume 30:Number 11(2015:Nov.)
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Record Type:: Journal Article
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4. Surface contamination and electrical damage by focused ion beam: conditions applicable to the extraction of TEM lamellae from nanoelectronic devices. (15th October 2015)

Authors:: Bender, H; Franquet, A; Drijbooms, C; Parmentier, B; Clarysse, T; Vandervorst, W; Kwakman, L
Journal:: Semiconductor science and technology
Issue:: Volume 30:Number 11(2015:Nov.)
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Record Type:: Journal Article
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