1. (Invited) Defect Spectroscopy and Engineering for Nanoscale Electron Device Applications: A Novel Simulation-Based Methodology. (26th April 2016) Authors: Larcher, Luca; Sereni, Gabriele; Vandelli, Luca Journal: ECS transactions Issue: Volume 72:Number 2(2016) Page Start: 167 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗