1. Adaptive Scanning in Ptychography through Deep Reinforcement Learning. (August 2021) Authors: Schloz, Marcel; Müller, Johannes; Pekin, Thomas; Van den Broek, Wouter; Koch, Christoph Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 818 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. ChemInform Abstract: Crystal Growth and Real Structure Effects of the First Weak 3D Stacked Topological Insulator Bi14Rh3I9. Issue 35 (8th August 2013) Authors: Rasche, Bertold; Isaeva, Anna; Gerisch, Alexander; Kaiser, Martin; Van den Broek, Wouter; Koch, Christoph T.; Kaiser, Ute; Ruck, Michael Journal: ChemInform Issue: Volume 44:Issue 35(2013) Page Start: no Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. ChemInform Abstract: New Environment for a Two‐Dimensional Topological Insulator with Hexagonal Channels Hosting Diiodido‐Bismuthate(I) Anions in a Singlet State. Issue 16 (March 2016) Authors: Rasche, Bertold; Van den Broek, Wouter; Ruck, Michael Journal: ChemInform Issue: Volume 47:Issue 16(2016) Page Start: no Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Comparison of Ptychography vs. Center-of-mass Analysis of Registered 4D-STEM Series. (August 2020) Authors: Haas, Benedikt; Schloz, Marcel; Mittelberger, Andreas; Lovejoy, Tracy; Müller, Johannes; Krivanek, Ondrej; Jones, Lewys; Van den Broek, Wouter; Koch, Christoph Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1898 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Features of Our SEM Transmission Diffraction Sub-stage with 6-axis Sample Control and a Camera with Variable Camera Length. (August 2020) Authors: Müller, Johannes; Haas, Benedikt; Van den Broek, Wouter; Shabih, Sherjeel; Koch, Christoph T. Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1906 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Improving 4DSTEM measurements of atomic charge and electrostatic potential via energy filtration. (August 2021) Authors: Pekin, Thomas; Schloz, Marcel; Haas, Benedikt; Van den Broek, Wouter; Koch, Christoph Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1450 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Real-Space Simulation of Electron Scattering in Imperfect Crystals and Reconstruction of the Electrostatic Potential. (23rd September 2015) Authors: Van den Broek, Wouter; Koch, Christoph T. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1883 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Real-Space Simulation of Electron Scattering in Imperfect Crystals and Reconstruction of the Electrostatic Potential. (August 2015) Authors: Van den Broek, Wouter; Koch, Christoph T. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1883 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗