Author/Creator: Ulrich, O. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ulrich, O.

1. KB scanning of X‐ray beam for Laue microdiffraction on accelero‐phobic samples: application to in situ mechanically loaded nanowires. (7th October 2016)

Authors:: Leclere, C.; Cornelius, T. W.; Ren, Z.; Robach, O.; Micha, J.-S.; Davydok, A.; Ulrich, O.; Richter, G.; Thomas, O.
Journal:: Journal of synchrotron radiation
Issue:: Volume 23:Part 6(2016)
Page Start:: 1395
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Laue‐DIC: a new method for improved stress field measurements at the micrometer scale. (8th May 2015)

Authors:: Petit, J.; Castelnau, O.; Bornert, M.; Zhang, F. G.; Hofmann, F.; Korsunsky, A. M.; Faurie, D.; Le Bourlot, C.; Micha, J. S.; Robach, O.; Ulrich, O.
Journal:: Journal of synchrotron radiation
Issue:: Volume 22:Part 4(2015)
Page Start:: 980
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. On the reversibility of dislocation slip during small scale low cycle fatigue. (1st August 2015)

Authors:: Kirchlechner, C.; Imrich, P.J.; Liegl, W.; Pörnbacher, J.; Micha, J.-S.; Ulrich, O.; Motz, C.
Journal:: Acta materialia
Issue:: Volume 94(2015)
Page Start:: 69
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. On the reversibility of dislocation slip during small scale low cycle fatigue. (1st August 2015)

Authors:: Kirchlechner, C.; Imrich, P.J.; Liegl, W.; Pörnbacher, J.; Micha, J.-S.; Ulrich, O.; Motz, C.
Journal:: Acta materialia
Issue:: Volume 94(2015)
Page Start:: 69
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Single‐shot full strain tensor determination with microbeam X‐ray Laue diffraction and a two‐dimensional energy‐dispersive detector. Issue 3 (30th May 2017)

Authors:: Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J. S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U.
Journal:: Journal of applied crystallography
Issue:: Volume 50:Issue 3(2017)
Page Start:: 901
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor for in situ X‐ray scattering investigations of growing nanoparticles and semiconductor nanowires. (8th April 2015)

Authors:: Cantelli, V.; Geaymond, O.; Ulrich, O.; Zhou, T.; Blanc, N.; Renaud, G.
Journal:: Journal of synchrotron radiation
Issue:: Volume 22:Part 3(2015)
Page Start:: 688
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗