1. An X‐ray Raman spectrometer for EXAFS studies on minerals: bent Laue spectrometer with 20 keV X‐rays. (8th February 2013) Authors: Hiraoka, N.; Fukui, H.; Tanida, H.; Toyokawa, H.; Cai, Y. Q.; Tsuei, K. D. Journal: Journal of synchrotron radiation Issue: Volume 20:Part 2(2013) Page Start: 266 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗