1. High-resolution and large-area nanoparticle arrays using EUV interference lithography1. Issue 16 (28th April 2015) Authors: Karim, Waiz; Tschupp, Simon Andreas; Oezaslan, Mehtap; Schmidt, Thomas J.; Gobrecht, Jens; van Bokhoven, Jeroen A.; Ekinci, Yasin Journal: Nanoscale Issue: Volume 7:Issue 16(2015) Page Start: 7386 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗