1. Time-of-Flight Secondary Ion Mass Spectroscopy with Bismuth Primary Ions of Clean and Air-Exposed Surfaces of Tellurium. Issue 6 (December 2014) Authors: Trzyna, Malgorzata; Berchenko, Nicolas; Rading, Derk; Cebulski, Jozef Journal: European journal of mass spectrometry Issue: Volume 20:Issue 6(2014) Page Start: 429 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗