1. A bayesian framework for image recognition based on hidden markov eigen‐image models. Issue 9 (30th May 2018) Authors: Sawada, Kei; Hashimoto, Kei; Nankaku, Yoshihiko; Tokuda, Keiichi Journal: IEEJ transactions on electrical and electronic engineering Issue: Volume 13:Issue 9(2018) Page Start: 1335 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗