1. Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows. (August 2020) Authors: Rickard, William D.A.; Reddy, Steven M.; Saxey, David W.; Fougerouse, Denis; Timms, Nicholas E.; Daly, Luke; Peterman, Emily; Cavosie, Aaron J.; Jourdan, Fred Editors: MacRae, Colin Journal: Microscopy and microanalysis Issue: Volume 26:Number 4(2020) Page Start: 750 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗