1. A dynamic scanning method based on signal‐statistics for scanning electron microscopy. Issue 3 (28th June 2013) Authors: Timischl, F. Journal: Scanning Issue: Volume 36:Issue 3(2014:May/Jun.) Page Start: 317 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advantages of Beam Deceleration for Low kV EDS Analysis. (23rd September 2015) Authors: Edwards, D.; Erdman, N.; Guarrera, D.; Shibata, M.; Robertson, V.; Timischl, F.; Nemoto, Y. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 681 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Advantages of Beam Deceleration for Low kV EDS Analysis. (August 2015) Authors: Edwards, D.; Erdman, N.; Guarrera, D.; Shibata, M.; Robertson, V.; Timischl, F.; Nemoto, Y. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 681 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. The contrast‐to‐noise ratio for image quality evaluation in scanning electron microscopy. Issue 1 (22nd December 2014) Authors: Timischl, F. Journal: Scanning Issue: Volume 37:Issue 1(2015:Jan./Feb.) Page Start: 54 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗