1. Phased array ultrasonic S-scan testing of near-detection-surface defects based on a background subtraction algorithm. (1st March 2022) Authors: Tian, Yukuo; Xu, Guocheng; Wei, Lingbo; Zhou, Guanghao; Lin, Yuting; Fan, Qiuyue; Gu, Xiaopeng Journal: Materials research express Issue: Volume 9:Number 3(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗