1. A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices. (June 2020) Authors: Lin, C.-Y.; Chen, P.-H.; Chang, T.-C.; Huang, W.-C.; Tan, Y.-F.; Lin, Y.-H.; Chen, W.-C.; Lin, C.-C.; Chang, Y.-F.; Chen, Y.-C.; Huang, H.-C.; Ma, X.-H.; Hao, Y.; Sze, S.M. Journal: Materials today physics Issue: Volume 13(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗