1. Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO2. (August 2019) Authors: Demoulin, R.; Roussel, M.; Duguay, S.; Muller, D.; Mathiot, D.; Pareige, P.; Talbot, E. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 2540 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗