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You searched for: Author/Creator Takeuchi, KanLimit your search
- Takeuchi, Kan [remove] 1
- 621.381505 1
- Electronic circuits -- Periodicals 1
- Electronic systems -- Periodicals 1
- oscillators -- stress analysis -- mechanical strength -- electric breakdown -- automotive electronics -- microcontrollers 1
- wear-out stress monitor -- voltage sensitive ring oscillators -- on-chip wear-out monitoring technique -- environmental condition monitoring -- digital circuit -- T-sensitive ring oscillator -- wear-out stress strength -- temperature conditions -- model-of-exponential dependence -- time-dependent dielectric breakdown -- total wear-out stress -- HKMG process -- T-VT-sensitive RO frequencies -- thermal activation energies -- automotive microcontrollers -- boosted voltages -- elevated temperatures -- advanced driver assistance systems -- size 28 nm 1