1. (Invited) Characterization of UV Excitation Accelerated Material Changes on as-Grown SiC Epitaxial Layers and Their Impact on Defect Detection. (23rd July 2018) Authors: Das, Hrishikesh; Sunkari, Swapna; Justice, Joshua; Konstantinov, Andrei; Gumaelius, Krister; Svedberg, Jan-Olov; Allerstam, Fredrik Journal: ECS transactions Issue: Volume 86:Number 12(2018) Page Start: 69 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗