1. Alpha Shape Analysis (ASA) Framework for Post- Clustering Property Determination in Atom Probe Tomographic Data. (April 2021) Authors: Still, Evan K.; Schreiber, Daniel K.; Wang, Jing; Hosemann, Peter Journal: Microscopy and microanalysis Issue: Volume 27:Number 2(2021) Page Start: 297 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Bulk and Short‐Circuit Anion Diffusion in Epitaxial Fe2O3 Films Quantified Using Buried Isotopic Tracer Layers. Issue 9 (9th March 2021) Authors: Kaspar, Tiffany C.; Taylor, Sandra D.; Yano, Kayla H.; Lach, Timothy G.; Zhou, Yadong; Zhu, Zihua; Kohnert, Aaron A.; Still, Evan K.; Hosemann, Peter; Spurgeon, Steven R.; Schreiber, Daniel K. Journal: Advanced materials interfaces Issue: Volume 8:Issue 9(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Fast Atomic Diffusion: Bulk and Short‐Circuit Anion Diffusion in Epitaxial Fe2O3 Films Quantified Using Buried Isotopic Tracer Layers (Adv. Mater. Interfaces 9/2021). Issue 9 (7th May 2021) Authors: Kaspar, Tiffany C.; Taylor, Sandra D.; Yano, Kayla H.; Lach, Timothy G.; Zhou, Yadong; Zhu, Zihua; Kohnert, Aaron A.; Still, Evan K.; Hosemann, Peter; Spurgeon, Steven R.; Schreiber, Daniel K. Journal: Advanced materials interfaces Issue: Volume 8:Issue 9(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗