1. Combining x-ray real and reciprocal space mapping techniques to explore the epitaxial growth of semiconductors. (15th June 2023) Authors: Magalhães, S; Cabaço, J S; Concepción, O; Buca, D; Stachowicz, M; Oliveira, F; Cerqueira, M F; Lorenz, K; Alves, E Journal: Journal of physics Issue: Volume 56:Number 24(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. The p-ZnO:N/i-Al2O3/n-GaN heterostructure—electron beam induced profiling, electrical properties and UV detectivity. (13th July 2015) Authors: Przezdziecka, E; Chusnutdinow, S; Guziewicz, E; Snigurenko, D; Stachowicz, M; Kopalko, K; Reszka, A; Kozanecki, A Journal: Journal of physics Issue: Volume 48:Number 32(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗