1. Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. (23rd June 2014) Authors: Hong, Shin; Staats, Matt; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg; Baudry, Benoit; Orso, Alessandro Journal: Software testing, verification & reliability Issue: Volume 25:Number 4(2015:Oct.) Page Start: 334 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗