1. Correlative Imaging of Phase Separation in Fe2TiO4 Thin Films Prepared by Conventional Ga and Xe Plasma FIB Processing. (August 2020) Authors: Spurgeon, Steven; Matthews, Bethany; Kelley, Ron; Kaspar, Tiffany; Chambers, Scott Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 186 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Evolution of Defect States from Different Starting States in La1-xSrxFeO3 Thin Films. (August 2021) Authors: Matthews, Bethany; Yano, Kayla; Taylor, Sandra; Sassi, Michel; Du, Yingge; Wang, Le; Hattar, Khalid; Spurgeon, Steven Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2906 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Examining Defect Creation at Interfaces in Electrocatalytically Cycled LaFeO3-SrTiO3 Thin Films. (August 2021) Authors: Matthews, Bethany; Yano, Kayla; Taylor, Sandra; Sassi, Michel; Paudel, Rajendra; Burton, Andricus; Farnum, Byron; Comes, Ryan; Spurgeon, Steven Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1178 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Influence of Irradiation-Induced Defects on Anion Transport in Epitaxial Cr2O3. (August 2021) Authors: Yano, Kayla; Kohnert, Aaron; Kaspar, Tiffany; Taylor, Sandra; Spurgeon, Steven; Kim, Hyosim; Wang, Yongqiang; Schreiber, Daniel Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2904 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Probing the Unique Radiation Damage Response of Oxide Interfaces Using Multi-modal STEM Imaging, Diffraction, and Spectroscopy. (August 2020) Authors: Spurgeon, Steven; Matthews, Bethany; Kaspar, Tiffany; Jiang, Weilin; Gigax, Jonathan; Shao, Lin; Shutthanandan, Vaithiyalingam; Sassi, Michel Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1666 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. (August 2020) Authors: Spurgeon, Steven; Matthews, Bethany; Sushko, Peter; Linpeng, Xiayu; Viitaniemi, Maria; Durnev, Mikhail; Glazov, Mikhail; Wieck, Andreas; Ludwig, Arne; Fu, Kai-Mei Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2822 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Single chip integrates transistors and photonic components. (14th March 2016) Authors: Spurgeon, Steven Journal: MRS bulletin Issue: Volume 41:Number 3(2016:Mar.) Page Start: 180 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. SPM scans the chemical landscape of manganite oxides. (3rd June 2015) Authors: Spurgeon, Steven Journal: MRS bulletin Issue: Volume 40:Number 6(2015:Jun.) Page Start: 465 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. The role of Nanocartography in the Development of Automated TEM. (August 2021) Authors: Olszta, Matthew; Fiedler, Kevin; Spurgeon, Steven; Reehl, Sarah; Hopkins, Derek Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2986 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗