1. Analysis of stress gradients in physical vapour deposition multilayers by X‐ray diffraction at fixed depth intervals. (4th February 2014) Authors: Fischer, G.; Selvadurai, U.; Nellesen, J.; Sprute, T.; Tillmann, W. Journal: Journal of applied crystallography Issue: Volume 47:Part 1(2014:Feb.) Page Start: 335 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗