1. High-resolution x-ray diffraction of epitaxial bismuth chalcogenide topological insulator layers. (2nd February 2017) Authors: Holý, V; Kriegner, D; Steiner, H; Stangl, J; Bauer, G; Springholz, G Journal: Advances in natural sciences Issue: Volume 8:Number 1(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗