1. Al2O3/HfO2 Multilayer High‐k Dielectric Stacks for Charge Trapping Flash Memories. Issue 16 (26th March 2018) Authors: Spassov, Dencho; Paskaleva, Albena; Krajewski, Tomasz A.; Guziewicz, Elzbieta; Luka, Grzegorz; Ivanov, Tzvetan Other Names: Guziewicz Elżbieta guestEditor.; Paskaleva Albena guestEditor.; Knez Mato guestEditor.; Österlund Lars guestEditor. Journal: Physica status solidi Issue: Volume 215:Issue 16(2018) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Analysis of Conduction and Charging Mechanisms in Atomic Layer Deposited Multilayered HfO2/Al2O3 Stacks for Use in Charge Trapping Flash Memories. (2nd May 2018) Authors: Novkovski, Nenad; Paskaleva, Albena; Skeparovski, Aleksandar; Spassov, Dencho Other Names: Hang Da-Ren Academic Editor. Journal: Advances in condensed matter physics Issue: Volume 2018(2018) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗