1. Correlation between low-frequency noise and interface traps of fully-depleted silicon-on-insulator tunneling FETs induced by hot carrier stress. (1st October 2020) Authors: Shin, Hyun-Jin; Song, Hyun-Dong; Song, Hyeong-Sub; Eadi, Sunil Babu; Choi, Hyun-Woong; Kim, Seong-Hyun; Kim, Do-Woo; Lee, Hi-Deok; Kwon, Hyuk-Min Journal: Japanese journal of applied physics Issue: Volume 59:Number 10(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗