1. Asymmetric skew X‐ray diffraction at fixed incidence angle: application to semiconductor nano‐objects. Issue 3 (23rd May 2016) Authors: Grigoriev, D.; Lazarev, S.; Schroth, P.; Minkevich, A.A.; Köhl, M.; Slobodskyy, T.; Helfrich, M.; Schaadt, D.M.; Aschenbrenner, T.; Hommel, D.; Baumbach, T. Journal: Journal of applied crystallography Issue: Volume 49:Issue 3(2016) Page Start: 961 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗