1. Advances in STEM and EELS: New Operation Modes, Detectors and Software. (August 2019) Authors: Bleloch, A.L.; Bacon, N.J.; Corbin, G.J.; Dellby, N.; Hoffman, M.V.; Hotz, M.T.; Hrncirik, P.; Johnson, N.; Lovejoy, T.C.; Meyer, C.E.; Mittelberger, A.; Plotkin-Swing, B.; Skone, G.S.; Szilagyi, Z.S.; Krivanek, O.L. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 512 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Using Nion Swift for Data Collection, Analysis and Display. (August 2014) Authors: Meyer, C.E.; Dellby, N.; Dellby, Z.; Lovejoy, T.C.; Sarahan, M.C.; Skone, G.S.; Krivanek, O.L. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1108 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Using Nion Swift for Data Collection, Analysis and Display. (August 2014) Authors: Meyer, C.E.; Dellby, N.; Dellby, Z.; Lovejoy, T.C.; Sarahan, M.C.; Skone, G.S.; Krivanek, O.L. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1108 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗