1. Atomistic investigation of the impact of stress during solid phase epitaxial regrowth. Issue 1 (9th December 2013) Authors: Sklenard, Benoit; Barbe, Jean‐Charles; Batude, Perrine; Rivallin, Pierrette; Tavernier, Clement; Cristoloveanu, Sorin; Martin‐Bragado, Ignacio; Cristiano, Fuccio; Pichler, Peter; Tavernier, Clément; Windl, Wolfgang Journal: Physica status solidi Issue: Volume 11:Issue 1(2014:Jan.) Page Start: 97 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Hybrid‐RRAM toward Next Generation of Nonvolatile Memory: Coupling of Oxygen Vacancies and Metal Ions. (23rd November 2018) Authors: Sassine, Gilbert; Nail, Cécile; Blaise, Philippe; Sklenard, Benoit; Bernard, Mathieu; Gassilloud, Rémy; Marty, Aurélie; Veillerot, Marc; Vallée, Christophe; Nowak, Etienne; Molas, Gabriel Journal: Advanced Electronic Materials Issue: Volume 5:Number 2(2019) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗