1. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. (February 2018) Authors: Kaczer, B.; Franco, J.; Weckx, P.; Roussel, Ph.J.; Putcha, V.; Bury, E.; Simicic, M.; Chasin, A.; Linten, D.; Parvais, B.; Catthoor, F.; Rzepa, G.; Waltl, M.; Grasser, T. Journal: Microelectronics and reliability Issue: Volume 81(2018) Page Start: 186 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Comphy — A compact-physics framework for unified modeling of BTI. (June 2018) Authors: Rzepa, G.; Franco, J.; O'Sullivan, B.; Subirats, A.; Simicic, M.; Hellings, G.; Weckx, P.; Jech, M.; Knobloch, T.; Waltl, M.; Roussel, P.J.; Linten, D.; Kaczer, B.; Grasser, T. Journal: Microelectronics and reliability Issue: Volume 85(2018) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits. (November 2016) Authors: Kaczer, B.; Franco, J.; Weckx, P.; Roussel, Ph.J.; Simicic, M.; Putcha, V.; Bury, E.; Cho, M.; Degraeve, R.; Linten, D.; Groeseneken, G.; Debacker, P.; Parvais, B.; Raghavan, P.; Catthoor, F.; Rzepa, G.; Waltl, M.; Goes, W.; Grasser, T. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 52 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits. (November 2016) Authors: Kaczer, B.; Franco, J.; Weckx, P.; Roussel, Ph.J.; Simicic, M.; Putcha, V.; Bury, E.; Cho, M.; Degraeve, R.; Linten, D.; Groeseneken, G.; Debacker, P.; Parvais, B.; Raghavan, P.; Catthoor, F.; Rzepa, G.; Waltl, M.; Goes, W.; Grasser, T. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 52 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗