1. Noise thermometry applied to thermoelectric measurements in InAs nanowires. (6th September 2016) Authors: Tikhonov, E S; Shovkun, D V; Ercolani, D; Rossella, F; Rocci, M; Sorba, L; Roddaro, S; Khrapai, V S Journal: Semiconductor science and technology Issue: Volume 31:Number 10(2016:Oct.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗