1. Assisting 4D-STEM Data Processing with Unsupervised Machine Learning. (August 2022) Authors: Han, Yimo; Shi, Chuqiao; Cao, Michael; Jiang, Yi Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 414 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Deep Learning Enabled Atom-by-Atom Analysis of 2D materials on the Million-Atom Scale. (August 2021) Authors: Lee, Chia-Hao; Khan, Abid; Luo, Di; Shi, Chuqiao; Zhang, Yue; Hossain, M. Abir; van der Zande, Arend; Clark, Bryan; Huang, Pinshane Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 904 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Deep Learning Enabled Measurements of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision. (August 2019) Authors: Lee, Chia-Hao; Shi, Chuqiao; Luo, Di; Khan, Abid; Janicek, Blanka E.; Kang, Sangmin; Zhu, Wenjuan; Clark, Bryan K.; Huang, Pinshane Y. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 172 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Detecting Vacancy-Induced Strain Field Oscillations via Deep Learning. (August 2020) Authors: Lee, Chia-Hao; Khan, Abid; Luo, Di; Santos, Tatiane; Shi, Chuqiao; Janicek, Blanka; Kang, Sangmin; Zhu, Wenjuan; Sobh, Nahil; Schleife, Andre; Clark, Bryan; Huang, Pinshane Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 14 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Growth of Large‐Sized 2D Ultrathin SnSe Crystals with In‐Plane Ferroelectricity. (14th February 2023) Authors: Chiu, Ming‐Hui; Ji, Xiang; Zhang, Tianyi; Mao, Nannan; Luo, Yue; Shi, Chuqiao; Zheng, Xudong; Liu, Hongwei; Han, Yimo; Wilson, William L.; Luo, Zhengtang; Tung, Vincent; Kong, Jing Journal: Advanced Electronic Materials Issue: Volume 9:Number 4(2023) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Probing the Strain Fields of Single-Atom Defects in 2D materials with Sub-Picometer Precision. (August 2021) Authors: Lee, Chia-Hao; Khan, Abid; Luo, Di; Santos, Tatiane; Shi, Chuqiao; Janicek, Blanka; Kang, Sangmin; Sobh, Nahil; Zhu, Wenjuan; Schleife, André; Clark, Bryan; Huang, Pinshane Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1944 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Rapid and Semi-Automated Analysis of 4D-STEM data via Unsupervised Learning. (August 2021) Authors: Shi, Chuqiao; Cao, Michael; Muller, David; Han, Yimo Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 58 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Uncovering In-Plane Domain Structures in Two-Dimensional Ferroelectric SnSe Using Machine-Learning Assisted 4D-STEM. (August 2022) Authors: Shi, Chuqiao; Mao, Nannan; Kong, Jing; Han, Yimo Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 374 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗