1. A Novel Multi‐hidden Semi‐Markov Model for Degradation State Identification and Remaining Useful Life Estimation. (8th October 2012) Authors: Su, Chun; Shen, Jinyun Journal: Quality and reliability engineering international Issue: Volume 29:Number 8(2013:Dec.) Page Start: 1181 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗