1. Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor. Issue 4 (2nd October 2018) Authors: Chen, Ke; Meng, Xianghai; He, Feng; Zhou, Yongjian; Jeong, Jihoon; Sheehan, Nathanial; Bank, Seth R; Wang, Yaguo Journal: Nanoscale and microscale thermophysical engineering Issue: Volume 22:Issue 4(2018) Page Start: 348 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Non-destructive measurement of photoexcited carrier transport in graphene with ultrafast grating imaging technique. (October 2016) Authors: Chen, Ke; Yogeesh, Maruthi Nagavalli; Huang, Yuan; Zhang, Shaoqing; He, Feng; Meng, Xianghai; Fang, Shaoyin; Sheehan, Nathanial; Tao, Tiger Hu; Bank, Seth R.; Lin, Jung-Fu; Akinwande, Deji; Sutter, Peter; Lai, Tianshu; Wang, Yaguo Journal: Carbon Issue: Volume 107(2016) Page Start: 233 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Non-destructive measurement of photoexcited carrier transport in graphene with ultrafast grating imaging technique. (October 2016) Authors: Chen, Ke; Yogeesh, Maruthi Nagavalli; Huang, Yuan; Zhang, Shaoqing; He, Feng; Meng, Xianghai; Fang, Shaoyin; Sheehan, Nathanial; Tao, Tiger Hu; Bank, Seth R.; Lin, Jung-Fu; Akinwande, Deji; Sutter, Peter; Lai, Tianshu; Wang, Yaguo Journal: Carbon Issue: Volume 107(2016) Page Start: 233 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗