1. Quantization noise consideration and characterization in Sigma-Delta MEMS accelerometer. (January 2016) Authors: Liu, Yun-Tao; Wang, Ying; Shao, Lei Journal: Microelectronics journal Issue: Volume 47(2016) Page Start: 53 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗