1. 3D Modelling of Fluctuation Effects in Highly Scaled VLSI Devices. Issue 1 (2001) Authors: Linton, Thomas D.; Yu, Shaofeng; Shaheed, Reaz Journal: VLSI design Issue: Volume 13:Issue 1/4(2001) Page Start: 103 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗