1. Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells. (February 2022) Authors: Kang, Dongkyun; Park, HyunJung; Choi, Dongjin; Han, Hyebin; Seol, Jaeseung; Kang, Yoonmook; Lee, Hae-Seok; Kim, Donghwan Journal: Solar energy Issue: Volume 233(2022) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗