1. Visualization of light-emitting diode lighting damage process in radiation environment by an in situ measurement. (1st July 2022) Authors: Hosaka, Yuji; Nishimori, Nobuyuki; Itoga, Toshiro; Nakazawa, Shingo; Tanaka, Shinichiro; Seno, Toshio; Kondo, Chikara; Inagaki, Takahiro; Fukui, Toru; Watanabe, Takahiro; Tanaka, Hitoshi Journal: Japanese journal of applied physics Issue: Volume 61:Number 7(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗