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Author/Creator Senf, Friedmar

2. Spectromicroscopy of Nanoscale Materials in the Tender X‐Ray Regime Enabled by a High Efficient Multilayer‐Based Grating Monochromator. Issue 1 (29th November 2022)

Authors:
Werner, Stephan; Guttmann, Peter; Siewert, Frank; Sokolov, Andrey; Mast, Matthias; Huang, Qiushi; Feng, Yufei; Li, Tongzhou; Senf, Friedmar; Follath, Rolf; Liao, Zhohngquan; Kutukova, Kristina; Zhang, Jian; Feng, Xinliang; Wang, Zhan‐Shan; Zschech, Ehrenfried; Schneider, Gerd
Journal:
Small methods
Issue:
Volume 7:Issue 1(2023)
Page Start:
n/a
Record Type:
Journal Article
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3. The meV XUV‐RIXS facility at UE112‐PGM1 of BESSY II. (26th April 2022)

Authors:
Bauer, Karl; Schmidt, Jan-Simon; Eggenstein, Frank; Decker, Régis; Ruotsalainen, Kari; Pietzsch, Annette; Blume, Thomas; Liu, Chun-Yu; Weniger, Christian; Siewert, Frank; Buchheim, Jana; Gwalt, Grzegorz; Senf, Friedmar; Bischoff, Peter; Schwarz, Lisa; Effland, Klaus; Mast, Matthias; Zeschke, Thom...
Journal:
Journal of synchrotron radiation
Issue:
Volume 29:Part 3(2022)
Page Start:
908
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗