Author/Creator: Schoenmaker, Wim - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Schoenmaker, Wim

1. A fast time‐domain EM–TCAD coupled simulation framework via matrix exponential with stiffness reduction. (26th June 2015)

Authors:: Chen, Quan; Schoenmaker, Wim; Weng, Shih‐Hung; Cheng, Chung‐Kuan; Chen, Guan‐Hua; Jiang, Li‐Jun; Wong, Ngai
Journal:: International journal of circuit theory and applications
Issue:: Volume 44:Number 4(2016:Apr.)
Page Start:: 833
Record Type:: Journal Article
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2. Coupled electro-magnetic field & Lorentz force effects in silicon and metal for ESD investigation in transient and harmonic regimes. Issue 9 (August 2015)

Authors:: Galy, Philippe; Schoenmaker, Wim
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1532
Record Type:: Journal Article
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3. Exploration of robustness limits and ESD EMI impact in a protection device for advanced CMOS technology. (September 2017)

Authors:: Galy, Philippe; Schoenmaker, Wim
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 680
Record Type:: Journal Article
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4. Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device. Issue 1 (2015)

Authors:: Putek, Piotr; Meuris, Peter; Günther, Michael; Maten, Jan ter; Pulch, Roland; Wieers, Aarnout; Schoenmaker, Wim
Journal:: IFAC-PapersOnLine
Issue:: Volume 48:Issue 1(2015)
Page Start:: 938
Record Type:: Journal Article
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5. Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device★. Issue 1 (2015)

Authors:: Putek, Piotr; Meuris, Peter; Günther, Michael; Maten, Jan ter; Pulch, Roland; Wieers, Aarnout; Schoenmaker, Wim
Journal:: IFAC-PapersOnLine
Issue:: Volume 48:Issue 1(2015)
Page Start:: 938
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗