1. Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks. (August 2021) Authors: Heimes, Damien; Scheunert, Jonas; Beyer, Andreas; Belz, Jürgen; Firoozabadi, Saleh; Volz, Kerstin Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 450 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗