1. Lateral Resolution Enhancement of Vertical Scanning Interferometry by Sub-Pixel Sampling. (7th January 2014) Authors: Arvidson, Rolf S.; Fischer, Cornelius; Sawyer, Dale S.; Scott, Gavin D.; Natelson, Douglas; Lüttge, Andreas Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 1 Page Start: 90 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Lateral Resolution Enhancement of Vertical Scanning Interferometry by Sub-Pixel Sampling. (7th January 2014) Authors: Arvidson, Rolf S.; Fischer, Cornelius; Sawyer, Dale S.; Scott, Gavin D.; Natelson, Douglas; Lüttge, Andreas Journal: Microscopy and microanalysis Issue: Volume 20:Number 1(2014:Feb.) Page Start: 90 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Lateral Resolution Enhancement of Vertical Scanning Interferometry by Sub-Pixel Sampling. (7th January 2014) Authors: Arvidson, Rolf S.; Fischer, Cornelius; Sawyer, Dale S.; Scott, Gavin D.; Natelson, Douglas; Lüttge, Andreas Journal: Microscopy and microanalysis Issue: Volume 20:Number 1(2014:Feb.) Page Start: 90 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗