1. On the characterization of ultra‐precise X‐ray optical components: advances and challenges in ex situ metrology. (1st September 2014) Authors: Siewert, F.; Buchheim, J.; Zeschke, T.; Störmer, M.; Falkenberg, G.; Sankari, R. Journal: Journal of synchrotron radiation Issue: Volume 21:Part 5(2014) Page Start: 968 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗