1. A Comparison of Cross Section Formulas and their Effect on Calculated k-factors. (August 2014) Authors: Sandborg, Alan; Camus, Patrick; Hammell, Brent Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 612 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A Comparison of Cross Section Formulas and their Effect on Calculated k-factors. (August 2014) Authors: Sandborg, Alan; Camus, Patrick; Hammell, Brent Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 612 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Performance of an Improved TEM SDD Detector. (August 2014) Authors: Colijn, Hendrik O.; Yang, Fan; Williams, D. B.; Sandborg, Alan; McComb, David W. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 608 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Performance of an Improved TEM SDD Detector. (August 2014) Authors: Colijn, Hendrik O.; Yang, Fan; Williams, D. B.; Sandborg, Alan; McComb, David W. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 608 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗