1. Application of Low kV EELS to Problematic Samples. (August 2019) Authors: Formo, Eric V.; Howe, Jane Y.; Sunaoshi, Takeshi; Muto, Atsushi; Kilcrease, Jim; Salguero, Tina Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 466 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗