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Author/Creator Salaun, Mathieu

1. Electromigration-induced failure in operando characterization of 3D interconnects: microstructure influence. Issue 8 (July 2015)

Authors:
Gousseau, Simon; Moreau, Stéphane; Bouchu, David; Farcy, Alexis; Montmitonnet, Pierre; Inal, Karim; Bay, François; Zelsmann, Marc; Picard, Emmanuel; Salaun, Mathieu
Journal:
Microelectronics and reliability
Issue:
Volume 55:Issue 8(2015)
Page Start:
1205
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

2. Soft Graphoepitaxy for Large Area Directed Self‐Assembly of Polystyrene‐block‐Poly(dimethylsiloxane) Block Copolymer on Nanopatterned POSS Substrates Fabricated by Nanoimprint Lithography. (27th April 2015)

Authors:
Borah, Dipu; Rasappa, Sozaraj; Salaun, Mathieu; Zellsman, Marc; Lorret, Olivier; Liontos, George; Ntetsikas, Konstantinos; Avgeropoulos, Apostolos; Morris, Michael A.
Journal:
Advanced functional materials
Issue:
Volume 25:Number 22(2015)
Page Start:
3425
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗