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Author/Creator Saitoh, Tohru

1. 23‐4: Channel‐Dimension‐Scalable Oxide Thin‐Film Transistor for High‐Resolution Pixel and Integrated Gate Driver. Issue 1 (29th May 2019)

Authors:
Hayashi, Hiroshi; Yamada, Tatsuya; Koshiishi, Ryo; Miura, Masanori; Terai, Yasuhiro; Oshima, Yoshihiro; Saitoh, Tohru; Hiromasu, Yasunobu; Arai, Toshiaki
Journal:
Digest of technical papers
Issue:
Volume 50:Issue 1(2019)
Page Start:
322
Record Type:
Journal Article
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2. AlO sputtered self‐aligned source/drain formation technology for highly reliable oxide thin film transistor backplane. Issue 10 (12th July 2018)

Authors:
Hayashi, Hiroshi; Murai, Atsuhito; Miura, Masanori; Imada, Tatsuo; Terai, Yasuhiro; Oshima, Yoshihiro; Saitoh, Tohru; Hiromasu, Yasunobu; Arai, Toshiaki
Journal:
Journal of the Society for Information Display
Issue:
Volume 26:Issue 10(2018)
Page Start:
583
Record Type:
Journal Article
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3. Invited Paper: Highly Reliable InGaZnO Thin Film Transistor Backplane for 55‐inch 4K2K Organic Light‐Emitting Diode Display. Issue 1 (June 2014)

Authors:
Hayashi, Hiroshi; Nakazaki, Yoshiaki; Izumi, Tomoaki; Sasaki, Atsushi; Nakamura, Tetsuroh; Takeda, Eiji; Saitoh, Tohru; Goto, Masashi; Takezawa, Hiroyoshi
Journal:
Digest of technical papers
Issue:
Volume 45:Issue 1(2014)
Page Start:
853
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗