1. Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides. (23rd September 2015) Authors: MacLaren, Ian; Yang, Hao; Jones, Lewys; Nellist, Peter D.; Ryll, Henning; Simson, Martin; Soltau, Heike; Kondo, Yukihito; Sagawa, Ryusuke; Banba, Hiroyuki Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1221 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides. (August 2015) Authors: MacLaren, Ian; Yang, Hao; Jones, Lewys; Nellist, Peter D.; Ryll, Henning; Simson, Martin; Soltau, Heike; Kondo, Yukihito; Sagawa, Ryusuke; Banba, Hiroyuki Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1221 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors. (August 2015) Authors: Yang, Hao; Jones, Lewys; Ryll, Henning; Simson, Martin; Soltau, Heike; Kondo, Yukihito; Sagawa, Ryusuke; Banba, Hiroyuki; Pennycook, Timothy J; Nellist, Peter D. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 2303 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Measuring Single Electrons – What Does it Mean?. (August 2019) Authors: Ryll, Henning; Huth, Martin; Ritz, Robert; O'Leary, Colum M.; Griffiths, Ian; Nellist, Peter; Sagawa, Ryusuke; Kondo, Yukihito; Soltau, Heike; Strüder, Lothar Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1654 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors. (23rd September 2015) Authors: Jones, Lewys; Yang, Hao; MacArthur, Katherine E.; Ryll, Henning; Simson, Martin; Soltau, Heike; Kondo, Yukihito; Sagawa, Ryusuke; Banba, Hiroyuki; Nellist, Peter D. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 2411 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors. (August 2015) Authors: Jones, Lewys; Yang, Hao; MacArthur, Katherine E.; Ryll, Henning; Simson, Martin; Soltau, Heike; Kondo, Yukihito; Sagawa, Ryusuke; Banba, Hiroyuki; Nellist, Peter D. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 2411 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. The pnCCD for Applications in Transmission Electron Microscopy: Further Development and New Operation Modes. (August 2014) Authors: Ryll, Henning; Hartmann, Robert; Huth, Martin; Ihle, Sebastian; Schmidt, Julia; Simson, Martin; Soltau, Heike; Strüder, Lothar Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1122 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. The pnCCD for Applications in Transmission Electron Microscopy: Further Development and New Operation Modes. (August 2014) Authors: Ryll, Henning; Hartmann, Robert; Huth, Martin; Ihle, Sebastian; Schmidt, Julia; Simson, Martin; Soltau, Heike; Strüder, Lothar Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1122 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗