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Author/Creator Ruzzarin, Maria

1. Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs. (30th January 2020)

Authors:
Mukherjee, Kalparupa; Borga, Matteo; Ruzzarin, Maria; De Santi, Carlo; Stoffels, Steve; You, Shuzhen; Geens, Karen; Liang, Hu; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Journal:
Applied physics express
Issue:
Volume 13:Number 2(2020)
Page Start:
Record Type:
Journal Article
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2. Degradation Mechanisms of GaN‐Based Vertical Devices: A Review. Issue 7 (22nd January 2020)

Authors:
Meneghini, Matteo; Fabris, Elena; Ruzzarin, Maria; De Santi, Carlo; Nomoto, Kazuki; Hu, Zhenqi; Li, Wenshen; Gao, Xingya; Jena, Debdeep; Xing, Huili Grace; Sun, Min; Palacios, Tomas; Meneghesso, Gaudenzio; Zanoni, Enrico
Other Names:
Shahedipour-Sandvik F. Shadi guestEditor.; Qhalid Fareed guestEditor.
Journal:
Physica status solidi
Issue:
Volume 217:Issue 7(2020)
Page Start:
n/a
Record Type:
Journal Article
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3. Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis. (September 2016)

Authors:
Rossetto, Isabella; Meneghini, Matteo; Rizzato, Vanessa; Ruzzarin, Maria; Favaron, Andrea; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico
Journal:
Microelectronics and reliability
Issue:
Volume 64(2016)
Page Start:
547
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

4. Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis. (September 2016)

Authors:
Rossetto, Isabella; Meneghini, Matteo; Rizzato, Vanessa; Ruzzarin, Maria; Favaron, Andrea; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico
Journal:
Microelectronics and reliability
Issue:
Volume 64(2016)
Page Start:
547
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗