1. Electrical Characterization of Silicon-on-Insulator Wafers Using Photo-Conductance Decay (PCD) Method. (16th December 2015) Authors: Arora, A.; Drummond, P. J.; Ruzyllo, J. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3069 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electrical Characterization of Silicon-on-Insulator Wafers Using Photo-Conductance Decay (PCD) Method. (1st January 2016) Authors: Arora, A.; Drummond, P. J.; Ruzyllo, J. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3069 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗